BibTeX records: Fuchen Mu

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@article{DBLP:journals/mr/MuXTD02,
  author       = {Fuchen Mu and
                  Mingzhen Xu and
                  Changhua Tan and
                  Xiaorong Duan},
  title        = {Weibull characteristics of n-MOSFET's with ultrathin gate oxides under
                  {FN} stress and lifetime prediction},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {6},
  pages        = {985--989},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00007-0},
  doi          = {10.1016/S0026-2714(02)00007-0},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MuXTD02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/MuTX01,
  author       = {Fuchen Mu and
                  Changhua Tan and
                  Mingzhen Xu},
  title        = {Proportional difference estimate method of determining characteristic
                  parameters of normal and log-normal distributions},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {1},
  pages        = {129--131},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00029-9},
  doi          = {10.1016/S0026-2714(00)00029-9},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MuTX01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/MuXTD01,
  author       = {Fuchen Mu and
                  Mingzhen Xu and
                  Changhua Tan and
                  Xiaorong Duan},
  title        = {A new lifetime prediction method for hot-carrier degradation in n-MOSFETs
                  with ultrathin gate oxides under V\({}_{\mbox{g}}\)=V\({}_{\mbox{d}}\)},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {11},
  pages        = {1909--1913},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00118-4},
  doi          = {10.1016/S0026-2714(01)00118-4},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MuXTD01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}