BibTeX records: H. B. Lo

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@article{DBLP:journals/mr/YanYHLY01,
  author       = {B. P. Yan and
                  Y. F. Yang and
                  C. C. Hsu and
                  H. B. Lo and
                  E. S. Yang},
  title        = {A reliability comparison of InGaP/GaAs HBTs with and without passivation
                  ledge},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {12},
  pages        = {1959--1963},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00222-0},
  doi          = {10.1016/S0026-2714(01)00222-0},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YanYHLY01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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