BibTeX records: Daniel Kraak

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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@inproceedings{DBLP:conf/latw/GursoyKATJH22,
  author       = {Cemil Cem G{\"{u}}rsoy and
                  Daniel Kraak and
                  Foisal Ahmed and
                  Mottaqiallah Taouil and
                  Maksim Jenihhin and
                  Said Hamdioui},
  title        = {On {BTI} Aging Rejuvenation in Memory Address Decoders},
  booktitle    = {23rd {IEEE} Latin American Test Symposium, {LATS} 2022, Montevideo,
                  Uruguay, September 5-8, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/LATS57337.2022.9936940},
  doi          = {10.1109/LATS57337.2022.9936940},
  timestamp    = {Sun, 20 Nov 2022 22:42:09 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/GursoyKATJH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/corr/abs-2212-09356,
  author       = {Cemil Cem G{\"{u}}rsoy and
                  Daniel Kraak and
                  Foisal Ahmed and
                  Mottaqiallah Taouil and
                  Maksim Jenihhin and
                  Said Hamdioui},
  title        = {On {BTI} Aging Rejuvenation in Memory Address Decoders},
  journal      = {CoRR},
  volume       = {abs/2212.09356},
  year         = {2022},
  url          = {https://doi.org/10.48550/arXiv.2212.09356},
  doi          = {10.48550/ARXIV.2212.09356},
  eprinttype    = {arXiv},
  eprint       = {2212.09356},
  timestamp    = {Tue, 03 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2212-09356.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/KraakTHWCC20,
  author       = {Daniel Kraak and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  title        = {Mitigation of Sense Amplifier Degradation Using Skewed Design},
  booktitle    = {2020 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
  pages        = {1614--1617},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.23919/DATE48585.2020.9116532},
  doi          = {10.23919/DATE48585.2020.9116532},
  timestamp    = {Thu, 25 Jun 2020 12:55:44 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraakTHWCC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dtis/KraakTHWCC20,
  author       = {Dani{\"{e}}l Kraak and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  title        = {eSRAM Reliability: Why is it still not optimally solved?},
  booktitle    = {15th Design {\&} Technology of Integrated Systems in Nanoscale
                  Era, {DTIS} 2020, Marrakech, Morocco, April 1-3, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DTIS48698.2020.9081145},
  doi          = {10.1109/DTIS48698.2020.9081145},
  timestamp    = {Mon, 11 May 2020 11:29:38 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/KraakTHWCC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/KraakTAHWCC19,
  author       = {Daniel Kraak and
                  Mottaqiallah Taouil and
                  Innocent Agbo and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  title        = {Parametric and Functional Degradation Analysis of Complete 14-nm FinFET
                  {SRAM}},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {27},
  number       = {6},
  pages        = {1308--1321},
  year         = {2019},
  url          = {https://doi.org/10.1109/TVLSI.2019.2902881},
  doi          = {10.1109/TVLSI.2019.2902881},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KraakTAHWCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/KraakATHWCC19,
  author       = {Daniel Kraak and
                  Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  editor       = {J{\"{u}}rgen Teich and
                  Franco Fummi},
  title        = {Methodology for Application-Dependent Degradation Analysis of Memory
                  Timing},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages        = {162--167},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/DATE.2019.8715143},
  doi          = {10.23919/DATE.2019.8715143},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraakATHWCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KraakATHWCC19,
  author       = {Daniel Kraak and
                  Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  title        = {Hardware-Based Aging Mitigation Scheme for Memory Address Decoder},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791536},
  doi          = {10.1109/ETS.2019.8791536},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/KraakATHWCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/KraakGATJRH19,
  author       = {Daniel H. P. Kraak and
                  Cemil Cem G{\"{u}}rsoy and
                  Innocent O. Agbo and
                  Mottaqiallah Taouil and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Said Hamdioui},
  title        = {Software-Based Mitigation for Memory Address Decoder Aging},
  booktitle    = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile,
                  March 11-13, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/LATW.2019.8704595},
  doi          = {10.1109/LATW.2019.8704595},
  timestamp    = {Sun, 25 Oct 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KraakGATJRH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AgboTKHWCCD18,
  author       = {Innocent Agbo and
                  Mottaqiallah Taouil and
                  Daniel Kraak and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor and
                  Wim Dehaene},
  title        = {Impact and mitigation of {SRAM} read path aging},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {158--167},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.011},
  doi          = {10.1016/J.MICROREL.2018.05.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AgboTKHWCCD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/KraakATHWCC18,
  author       = {Daniel Kraak and
                  Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  editor       = {Jan Madsen and
                  Ayse K. Coskun},
  title        = {Degradation analysis of high performance 14nm FinFET {SRAM}},
  booktitle    = {2018 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages        = {201--206},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.23919/DATE.2018.8342003},
  doi          = {10.23919/DATE.2018.8342003},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraakATHWCC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KraakTHWCCSWK18,
  author       = {Daniel Kraak and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Francky Catthoor and
                  Abhijit Chatterjee and
                  Adit D. Singh and
                  Hans{-}Joachim Wunderlich and
                  Naghmeh Karimi},
  title        = {Device aging: {A} reliability and security concern},
  booktitle    = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
                  May 28 - June 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETS.2018.8400702},
  doi          = {10.1109/ETS.2018.8400702},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/KraakTHWCCSWK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/AgboTKHKWRC17,
  author       = {Innocent Agbo and
                  Mottaqiallah Taouil and
                  Daniel Kraak and
                  Said Hamdioui and
                  Halil Kukner and
                  Pieter Weckx and
                  Praveen Raghavan and
                  Francky Catthoor},
  title        = {Integral Impact of BTI, {PVT} Variation, and Workload on {SRAM} Sense
                  Amplifier},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {25},
  number       = {4},
  pages        = {1444--1454},
  year         = {2017},
  url          = {https://doi.org/10.1109/TVLSI.2016.2643618},
  doi          = {10.1109/TVLSI.2016.2643618},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/AgboTKHKWRC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/KraakTAHWCC17,
  author       = {Daniel Kraak and
                  Mottaqiallah Taouil and
                  Innocent Agbo and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  title        = {Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic
                  Workloads},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {25},
  number       = {12},
  pages        = {3464--3472},
  year         = {2017},
  url          = {https://doi.org/10.1109/TVLSI.2017.2746798},
  doi          = {10.1109/TVLSI.2017.2746798},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KraakTAHWCC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/KraakATHWCCD17,
  author       = {Daniel Kraak and
                  Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor and
                  Wim Dehaene},
  editor       = {David Atienza and
                  Giorgio Di Natale},
  title        = {Mitigation of sense amplifier degradation using input switching},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages        = {858--863},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.23919/DATE.2017.7927107},
  doi          = {10.23919/DATE.2017.7927107},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraakATHWCCD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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