BibTeX records: Rex Kiang

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@inproceedings{DBLP:conf/itc/TrahanK92,
  author       = {Robert Trahan and
                  Rex Kiang},
  title        = {An Analysis of the Die Testing Process Using Taguchi Techniques and
                  Circuit Diagnostics},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {260--269},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527832},
  doi          = {10.1109/TEST.1992.527832},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TrahanK92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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