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ORCIDTechnometrics, Volume 46
Volume 46, Number 1, 2004
- V. Roshan Joseph
, Chien-Fu Jeff Wu:
Failure Amplification Method: An Information Maximization Approach to Categorical Response Optimization. 1-12 - Mary G. Leitnaker, Robert W. Mee:
Discussion. 12-14 - William Q. Meeker, Luis A. Escobar:
Discussion. 15-16 - Masami Miyakawa:
Discussion. 16-19 - Vijayan N. Nair, Xiao Wang:
Discussion. 19-23 - Agus Sudjianto:
Discussion. 23-24 - Don P. Clausing:
Operating Window: An Engineering Measure for Robustness. 25-29 - V. Roshan Joseph, Chien-Fu Jeff Wu:
Response. 30-31 - Yufeng Liu, Angela M. Dean:
k-Circulant Supersaturated Designs. 32-43 - K. Krishnamoorthy, Thomas Mathew:
One-Sided Tolerance Limits in Balanced and Unbalanced One-Way Random Models Based on Generalized Confidence Intervals. 44-52 - Nitin Kaistha, Charles F. Moore, Mary G. Leitnaker:
A Statistical Process Control Framework for the Characterization of Variation in Batch Profiles. 53-68 - Shiling Ruan, Douglas A. Wolfe, Weilong Zhang, Gerald S. Frankel:
Statistical Modeling of Minimum Intergranular Corrosion Path Length in High-Strength Aluminum Alloy. 69-75 - Irène Gijbels, Anne-Cécile Goderniaux:
Bandwidth Selection for Changepoint Estimation in Nonparametric Regression. 76-86 - Peihua Qiu:
The Local Piecewisely Linear Kernel Smoothing Procedure for Fitting Jump Regression Surfaces. 87-98 - Geoffrey Jones:
Markov Chain Monte Carlo Estimation for the Two-Component Model. 99-107
- Eric R. Ziegel:
A User-Friendly Guide to Multivariate Calibration and Classification. 108-110 - David E. Booth:
Chemometrics: Data Analysis for the Laboratory and Chemical Plant. 110 - James T. Wassell:
Statistics With Applications in Biology and Geology. 111 - Nalini Ravishanker:
Survival Analysis. 111-112 - Ramalingam Shanmugam:
The Stress-Strength Model and Its Generalizations: Theory and Applications. 112 - William S. Griffith:
Optimal Reliability Modeling: Principles and Applications. 112 - Robert V. Brill:
Applied Statistics and Probability for Engineers. 112-113 - Donald B. Percival:
Probability, Statistical Optics, and Data Testing: A Problem Solving Approach. 113-114 - David E. Booth:
Teaching Statistics. 114 - Z. Q. John Lu:
Nonlinear Time Series: Nonparametric and Parametric Methods. 114-115 - Maliha S. Nash:
Spatial Statistics and Computational Methods. 115-116 - Nicholas Rose:
Spatial Cluster Modelling. 116 - Z. Q. John Lu:
Modelling and Forecasting Financial Data: Techniques of Nonlinear Dynamics. 116-117 - Steven M. Lalonde:
Combined Survey Sampling Inference. 117 - Jeffrey E. Jarrett:
Making Sense of Data. 117-118 - John D. Barrett:
Quality From Customer Needs to Customer Satisfaction. 118
Volume 46, Number 2, 2004
- Nan Lin, Barbara A. Bailey, Xuming He, William G. Buttlar:
Adjustment of Measuring Devices With Linear Models. 127-134 - Robert G. McLeod, John F. Brewster:
The Design of Blocked Fractional Factorial Split-Plot Experiments. 135-146 - Kai-Tai Fang, Rahul Mukerjee:
Optimal Selection of Augmented Pairs Designs for Response Surface Modeling. 147-152 - C. Shane Reese, Alyson G. Wilson, Michael S. Hamada, Harry F. Martz, Kenneth Joseph Ryan:
Integrated Analysis of Computer and Physical Experiments. 153-164 - David Mease, Vijayan N. Nair, Agus Sudjianto:
Selective Assembly in Manufacturing: Statistical Issues and Optimal Binning Strategies. 165-175 - Guillermo Miró Quesada, Enrique del Castillo:
A Dual-Response Approach to the Multivariate Robust Parameter Design Problem. 176-187 - Daniel W. Apley, Jeong-Bae Kim:
Cautious Control of Industrial Process Variability With Uncertain Input and Disturbance Model Parameters. 188-199 - Marion R. Reynolds Jr., Zachary G. Stoumbos:
Control Charts and the Efficient Allocation of Sampling Resources. 200-214 - Victor Chan, Soumendra Nath Lahiri, William Q. Meeker:
Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation. 215-224 - Brandon J. Whitcher:
Wavelet-Based Estimation for Seasonal Long-Memory Processes. 225-238 - Dulal K. Bhaumik, Robert D. Gibbons:
An Upper Prediction Limit for the Arithmetic Mean of a Lognormal Random Variable. 239-248
- Thomas H. Short:
Applied Bayesian Modelling. 249-250 - Thomas L. Burr:
Bayesian Inference: Parameter Estimation and Decisions. 250-251 - Refik Soyer:
Bayesian Methods for Nonlinear Classification and Regression. 251-252 - Alan David Hutson:
Resampling Methods for Dependent Data. 252 - B. D. McCullough:
Random Number Generation and Monte Carlo Methods. 252-253 - David Drain:
Data Matters: Conceptual Statistics for a Random World. 253-254 - Tena I. Katsaounis:
Analyzing Multivariate Data. 254-255 - Nairanjana Dasgupta:
Analyzing Categorical Data. 255-256 - Lora S. Zimmer:
Applied Probability. 256 - Robert L. Schaefer:
Intro Stats. 256-257 - Jeffrey D. Scargle:
An Introduction to the Theory of Point Processes, Vol. I: Elementary Theory and Methods. 257 - Joseph D. Conklin:
Sample Survey Theory: Some Pythagorean Perspectives. 257-258 - Berton H. Gunter:
Data Analysis and Graphics Using R: An Example-Based Approach. 258-260 - Errol C. Caby:
Data Mining Using SAS Applications. 260-261 - Shin Ta Liu:
SAS® Survival Analysis Techniques for Medical Research. 261
Volume 46, Number 3, 2004
- Shao-Wei Cheng, William Li, Kenny Q. Ye:
Blocked Nonregular Two-Level Factorial Designs. 269-279 - Hongquan Xu, Shao-Wei Cheng, C. F. Jeff Wu:
Optimal Projective Three-Level Designs for Factor Screening and Interaction Detection. 280-292 - Peter J. Rousseeuw, Stefan Van Aelst, Katrien van Driessen, Jose A. Gulló:
Robust Multivariate Regression. 293-305 - Xiaotong Shen, Hsin-Cheng Huang, Jimmy Ye:
Adaptive Model Selection and Assessment for Exponential Family Distributions. 306-317 - Rita Singh, Bhiksha Raj:
Classification in Likelihood Spaces. 318-329 - Madhuchhanda Bhattacharjee, Jayant V. Deshpande, U. V. Naik-Nimbalkar:
Unconditional Tests of Goodness of Fit for the Intensity of Time-Truncated Nonhomogeneous Poisson Processes. 330-338 - Rajeshwari Natarajan, Govind S. Mudholkar:
Moment-Based Goodness-of-Fit Tests for the Inverse Gaussian Distribution. 339-347 - Stefan H. Steiner, R. Jock MacKay:
Scale Counting. 348-354 - John J. Peterson, Suntara Cahya, Enrique del Castillo:
Letter to the Editor. 355-357 - Steven G. Gilmour, Norman R. Draper:
Response. 358
- Hoon Kim:
Probability, Statistics, and Random Processes for Engineers. 360-361 - Richard A. Lewis:
Applied Simulation Modeling. 360-361 - Norman Bresky:
Risk Analysis in Engineering and Economics. 361-362 - V. Roshan Joseph:
Statistics and Probability for Engineering Applications With Microsoft® Excel. 361-362 - Heidi B. Goldfarb:
Statistical Methods for Six Sigma in R&D and Manufacturing. 362-363 - Walter T. Morgan:
Six Sigma and Beyond: Statistical Process Control. 362-363 - John Grego:
Bayesian Data Analysis. 363-364 - Snigdhansu Chatterjee:
Order Statistics. 364-365 - Lori B. Pfahler:
Range Based Analysis of Means. 364-365 - Thomas E. Wehrly:
An Invariant Approach to Statistical Analysis of Shapes. 364-365 - Eric R. Ziegel:
Statistical Tools for Environmental Quality Measurement. 365-366 - David L. Rumpf:
Statistics for Dummies. 366-367 - Haikady N. Nagaraja:
Measures of Interobserver Agreement. 367-368 - Tim Hesterberg:
Introduction to Stochastic Search and Optimization: Estimation, Simulation, and Control. 368-369 - Madhuri S. Mulekar:
Data Mining: Multimedia, Soft Computing, and Bioinformatics. 368-369 - William J. Owen:
Modeling the Internet and the Web. 369-370
Volume 46, Number 4, 2004
- William I. Notz:
Editor's Report. 377-379
- Mahmoud A. Mahmoud, William H. Woodall:
Phase I Analysis of Linear Profiles With Calibration Applications. 380-391 - Julie Badcock, Trevor C. Bailey, Philip Jonathan, Wojtek J. Krzanowski:
Two Projection Methods for Use in the Analysis of Multivariate Process Data With an Illustration in Petrochemical Production. 392-403 - Patrick G. Arbogast, Edward J. Bedrick:
Model-Checking Techniques for Linear Models With Parametric Variance Functions. 404-410 - David M. Steinberg, Dizza Bursztyn:
Data Analytic Tools for Understanding Random Field Regression Models. 411-420 - C. Messan Setodji, R. Dennis Cook:
K-Means Inverse Regression. 421-429 - Enrique F. Castillo, Ali S. Hadi, Antonio J. Conejo, Alfonso Fernández-Canteli:
A General Method for Local Sensitivity Analysis With Application to Regression Models and Other Optimization Problems. 430-444 - Neil A. Butler:
Construction of Two-Level Split-Lot Fractional Factorial Designs for Multistage Processes. 445-451 - Michael S. Hamada, Val Johnson, Leslie M. Moore, Joanne Wendelberger:
Bayesian Prediction Intervals and Their Relationship to Tolerance Intervals. 452-459 - Suk Joo Bae, Paul H. Kvam:
A Nonlinear Random-Coefficients Model for Degradation Testing. 460-469 - H. K. T. Ng, Ping Shing Chan, Narayanaswamy Balakrishnan:
Optimal Progressive Censoring Plans for the Weibull Distribution. 470-481
- Tena I. Katsaounis:
Exploring Multivariate Data with the Forward Search. 483-484 - Rick L. Edgeman:
Multivariate Statistical Process Control with Industrial Applications. 484-485 - S. Ejaz Ahmed:
Applied Adaptive Statistical Methods: Tests of Significance and Confidence Intervals. 484-485 - Necip Doganaksoy:
Weibull Models. 485-486 - Christopher L. Stanard:
Reliability Verification, Testing, and Analysis in Engineering Design. 486-487 - W. Robert Stephenson:
Nonparametric Statistical Methods for Complete and Censored Data. 487-488 - Stergios B. Fotopoulos:
Introduction to Modern Nonparametric Statistics. 488-489 - Lih-Yuan Deng:
The Design and Analysis of Computer Experiments. 488-489 - Aldous G. Wong:
Design of Experiments and Other Six Sigma Related Methods Explained and Derived. 489-490 - Thomas J. Bzik:
Six Sigma and Beyond: Design of Experiments. 489-490 - Harriet Black Nembhard:
Applying Contemporary Statistical Techniques. 490-491 - Mark Bailey:
Statistical Reasoning for Everyday Life. 490-491 - Steven M. Lalonde:
Probability and Statistics for Computer Science. 491-492 - Raid Amin:
Applied Statistics: Analysis of Variance and Regression. 491-492 - David J. Olive:
Introduction to Applied Statistics: a Modelling Approach. 492-493 - Timothy C. Coburn:
Statistical and Econometric Methods for Transportation Data Analysis. 492-493 - Douglas B. Clarkson:
Measurement Error and Misclassification in Statistics and Epidemiology: Impact and Bayesian Adjustments. 493-494 - Lewis Van Brackle:
Step-by-step Basic Statistics Using Sas®: Student Guide. 494-495 - Eric R. Ziegel:
Computer-aided Multivariate Analysis. 495-496 - Eric R. Ziegel:
System Reliability Theory: Models, Statistical Methods, and Applications. 495-496 - Eric R. Ziegel:
Six Sigma and Beyond: The Implementation Process. 495-496 - Eric R. Ziegel:
World Class Reliability. 496 - Eric R. Ziegel:
Probability and Statistics for Engineering and the Sciences. 497-498 - Eric R. Ziegel:
Analysis of Survey Data. 497-498 - Eric R. Ziegel:
Spectral Analysis of Time-series Data. 497-498 - Eric R. Ziegel:
Statistics and Chemometrics for Analytical Chemistry. 498-499 - Eric R. Ziegel:
Environmental Statistics: Methods and Applications. 498-499 - Eric R. Ziegel:
Data Analysis for Managers with Microsoft® Excel. 499-500 - Eric R. Ziegel:
Statistical Size Distributions in Economics and Actuarial Sciences. 499-500 - Eric R. Ziegel:
Clinical Trials in Oncology, Design and Analysis of Quality of Life Studies in Clinical Trials. 500-501
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