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ORCIDMicroelectronics Reliability, Volume 75
Volume 75, August 2017
- Dong Wang
, Fangfang Yang, Yang Zhao, Kwok-Leung Tsui:
Prognostics of Lithium-ion batteries based on state space modeling with heterogeneous noise variances. 1-8 - Isaí Hernández, César Adrián Pons-Flores, Ivan Garduño, Julio C. Tinoco, Israel Mejia, Magali Estrada:
Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. 9-13 - Thomas Santini, Sébastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall, Bruno Allard:
Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. 14-19 - Yan Zeng, Xiaojin Li, YanLing Wang, Yabin Sun, Yanling Shi, Ao Guo, ShaoJian Hu, Shoumian Chen, Yuhang Zhao:
Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered. 20-26 - L. Hua, H. N. Hou:
Electrochemical corrosion and electrochemical migration of 64Sn-35Bi-1Ag solder doping with xGe on printed circuit boards. 27-36 - Zhixing Lv, Nan Yan, Bingliang Bao:
Pin-pin ESD protection for electro-explosive device under severe human body ESD. 37-42 - Yun-Na Sun, Dongwoo Kang, Yazhou Zhang, Jiangbo Luo, Yanmei Liu, Yan Wang, Guifu Ding:
Plastic analysis for through silicon via with actual etching defect of triangular-teeth and scallops. 43-52 - Kunmo Chu, Changseung Lee, Sung-Hoon Park, Yoonchul Sohn:
Effects of Ag addition and Ag3Sn formation on the mechanical reliability of Ni/Sn solder joints. 53-58 - Federico Giacci, Stefano Dellea, Giacomo Langfelder:
Signal integrity in capacitive and piezoresistive single- and multi-axis MEMS gyroscopes under vibrations. 59-68 - Minru Hao, Huiyong Hu, Chen-Guang Liao, Bin Wang, Haiyan Kang, He-Ming Zhang:
Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET. 69-76 - Shunfeng Cheng, Chien-Ming Huang, Michael G. Pecht:
A review of lead-free solders for electronics applications. 77-95 - Kamil Janeczek:
Reliability analysis of UHF RFID tags under long-term mechanical cycling. 96-101 - Shipeng Yi, Zhengwei Du:
The influence of microwave pulse width on the thermal burnout effect of a PIN diode limiting-amplifying system. 102-109 - Anees Ullah, Ernesto Sánchez, Luca Sterpone, Luis Andrés Cardona, Carles Ferrer:
An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs. 110-120 - J.-H. Jeong, J.-H. Kim, Chung-Seog Oh:
Quantitative evaluation of bending reliability for a flexible near-field communication tag. 121-126 - Zhi-Hao Zhang, Xi-Shu Wang, Huai-Hui Ren, Su Jia, Hui-Hua Yang:
Simulation study on thermo-fatigue failure behavior of solder joints in package-on-package structure. 127-134 - Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei:
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs. 135-141 - Yuchen Song, Datong Liu, Chen Yang, Yu Peng:
Data-driven hybrid remaining useful life estimation approach for spacecraft lithium-ion battery. 142-153 - Slah Hlali, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi:
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. 154-161 - Liangbiao Chen, Jiang Zhou, Hsing-wei Chu, Guoqi Zhang, Xuejun Fan:
Modeling nonlinear moisture diffusion in inhomogeneous media. 162-170 - Zhen Chen, Yang Peng, Hao Cheng, Zizhou Yang, Mingxiang Chen:
Void-free and high-speed filling of through ceramic holes by copper electroplating. 171-177 - Babak Aghaei:
A high fault coverage test approach for communication channels in network on chip. 178-186 - A. E. Hammad, A. A. Ibrahiem:
Enhancing the microstructure and tensile creep resistance of Sn-3.0Ag-0.5Cu solder alloy by reinforcing nano-sized ZnO particles. 187-194 - Qiang Miao, Datong Liu:
Recent progress on electro-mechanical system prognostics and health management. 195-196 - Gang Niu, Hao Li:
IETM centered intelligent maintenance system integrating fuzzy semantic inference and data fusion. 197-204 - Xuezong Bai, Zongwen An, Yunfeng Hou, Qiang Ma:
Health assessment and management of wind turbine blade based on the fatigue test data. 205-214 - Li Zhang, Hongli Gao, Juan Wen, Shichao Li, Qi Liu:
A deep learning-based recognition method for degradation monitoring of ball screw with multi-sensor data fusion. 215-222 - Qiang Miao, Xin Zhang, Zhiwen Liu, Heng Zhang:
Condition multi-classification and evaluation of system degradation process using an improved support vector machine. 223-232 - Yunxia Chen, Yi Jin, Rui Kang:
Coupling damage and reliability modeling for creep and fatigue of solder joint. 233-238 - Wei Guo, Zheming Zhou, Cheng Chen, Xiang Li:
Multi-frequency weak signal detection based on multi-segment cascaded stochastic resonance for rolling bearings. 239-252 - Yujie Zhang, Datong Liu, Jinxiang Yu, Yu Peng, Xiyuan Peng:
EMA remaining useful life prediction with weighted bagging GPR algorithm. 253-263 - Liansheng Liu, Shaojun Wang, Datong Liu, Yu Peng:
Quantitative selection of sensor data based on improved permutation entropy for system remaining useful life prediction. 264-270 - Xiaoyang Li, Yue Liu, Rui Kang, Lianghua Xiao:
Service reliability modeling and evaluation of active-active cloud data center based on the IT infrastructure. 271-282 - Tianpei Zu, Meilin Wen, Rui Kang:
An optimal evaluating method for uncertainty metrics in reliability based on uncertain data envelopment analysis. 283-287 - Xin Zhang, Qiang Miao, Zhiwen Liu:
Remaining useful life prediction of lithium-ion battery using an improved UPF method based on MCMC. 288-295 - Xiaoxuan Jiao, Bo Jing, Yifeng Huang, Juan Li, Guangyue Xu:
Research on fault diagnosis of airborne fuel pump based on EMD and probabilistic neural networks. 296-308 - Feng Wu, Yang Hao, Jin Zhao, Yang Liu:
Current similarity based open-circuit fault diagnosis for induction motor drives with discrete wavelet transform. 309-316 - Jiawei Xiang, Yongteng Zhong:
A fault detection strategy using the enhancement ensemble empirical mode decomposition and random decrement technique. 317-326 - Zhiqiang Chen, Shengcai Deng, Xudong Chen, Chuan Li, René-Vinicio Sánchez, Huafeng Qin:
Deep neural networks-based rolling bearing fault diagnosis. 327-333
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