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ORCID23rd ISSRE 2012: Dallas, TX, USA - Workshops
- 23rd IEEE International Symposium on Software Reliability Engineering, ISSRE 2012, Dallas, TX, USA, November 27-30, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-4638-2
- Elmahdi Omar, Sudipto Ghosh:
An Exploratory Study of Higher Order Mutation Testing in Aspect-Oriented Programming. 1-10 - René Just, Gregory M. Kapfhammer, Franz Schweiggert:
Using Non-redundant Mutation Operators and Test Suite Prioritization to Achieve Efficient and Scalable Mutation Analysis. 11-20 - Lorena Gutiérrez-Madronal
, Hossain Shahriar, Mohammad Zulkernine, Juan José Domínguez-Jiménez, Inmaculada Medina-Bulo:
Mutation Testing of Event Processing Queries. 21-30 - Antonio Pecchia, Stefano Russo:
Detection of Software Failures through Event Logs: An Experimental Study. 31-40 - Peter T. Popov, Vladimir Stankovic, Lorenzo Strigini:
An Empirical Study of the Effectiveness of "Forcing" Diversity Based on a Large Population of Diverse Programs. 41-50 - Young Joo Kim, Moonzoo Kim:
Hybrid Statistical Model Checking Technique for Reliable Safety Critical Systems. 51-60 - Frédéric Massicotte, Yvan Labiche:
On the Verification and Validation of Signature-Based, Network Intrusion Detection Systems. 61-70 - Edward Condon, Michel Cukier:
Using Population Characteristics to Build Forecasting Models for Computer Security Incidents. 71-80 - Katerina Goseva-Popstojanova, Goce Anastasovski, Risto Pantev:
Using Multiclass Machine Learning Methods to Classify Malicious Behaviors Aimed at Web Systems. 81-90 - Fabrizio Pastore, Leonardo Mariani, Alberto Goffi, Manuel Oriol, Michael Wahler:
Dynamic Analysis of Upgrades in C/C++ Software. 91-100 - Yufeng Zhang, Zhenbang Chen, Ji Wang:
Speculative Symbolic Execution. 101-110 - William G. J. Halfond:
Automated Checking of Web Application Invocations. 111-120 - Friedrich Steimann, Marcus Frenkel:
Improving Coverage-Based Localization of Multiple Faults Using Algorithms from Integer Linear Programming. 121-130 - Fumio Machida, Jianwen Xiang, Kumiko Tadano, Yoshiharu Maeno:
Software Life-Extension: A New Countermeasure to Software Aging. 131-140 - Yian Zhu, Yue Li, Jingling Xue, Tian Tan, Jialong Shi, Yang Shen, Chunyan Ma:
What Is System Hang and How to Handle It. 141-150 - Tobias Wüchner, Alexander Pretschner:
Data Loss Prevention Based on Data-Driven Usage Control. 151-160 - Alex Groce, Alan Fern, Jervis Pinto, Tim Bauer, Mohammad Amin Alipour, Martin Erwig, Camden Lopez:
Lightweight Automated Testing with Adaptation-Based Programming. 161-170 - Teng Long, Il-Chul Yoon, Adam A. Porter, Alan Sussman, Atif M. Memon:
Overlap and Synergy in Testing Software Components across Loosely Coupled Communities. 171-180 - Gigon Bae, Gregg Rothermel, Doo-Hwan Bae:
On the Relative Strengths of Model-Based and Dynamic Event Extraction-Based GUI Testing Techniques: An Empirical Study. 181-190 - Bertrand Sobesto, Michel Cukier, David Maimon:
Are Computer Focused Crimes Impacted by System Configurations? An Empirical Study. 191-200 - Nuno Antunes, Marco Vieira:
Evaluating and Improving Penetration Testing in Web Services. 201-210 - Antonio Bovenzi, Domenico Cotroneo, Roberto Pietrantuono, Stefano Russo:
On the Aging Effects Due to Concurrency Bugs: A Case Study on MySQL. 211-220 - Chang Hwan Peter Kim, Sarfraz Khurshid, Don S. Batory:
Shared Execution for Efficiently Testing Product Lines. 221-230 - João Antunes, Nuno Ferreira Neves:
Recycling Test Cases to Detect Security Vulnerabilities. 231-240 - Leonardo Mariani, Alessandro Marchetto, Cu D. Nguyen, Paolo Tonella, Arthur I. Baars:
Revolution: Automatic Evolution of Mined Specifications. 241-250 - Myra B. Cohen, Si Huang, Atif M. Memon:
AutoInSpec: Using Missing Test Coverage to Improve Specifications in GUIs. 251-260 - Niklas Mellegård, Miroslaw Staron, Fredrik Törner:
A Light-Weight Defect Classification Scheme for Embedded Automotive Software and Its Initial Evaluation. 261-270 - Ferdian Thung, Shaowei Wang, David Lo, Lingxiao Jiang:
An Empirical Study of Bugs in Machine Learning Systems. 271-280 - Alois Mayr, Reinhold Plösch, Michael Kläs, Constanza Lampasona, Matthias Saft:
A Comprehensive Code-Based Quality Model for Embedded Systems: Systematic Development and Validation by Industrial Projects. 281-290 - Jean-Marie Mottu, Sagar Sen, Massimo Tisi, Jordi Cabot:
Static Analysis of Model Transformations for Effective Test Generation. 291-300 - Stephan Arlt, Andreas Podelski, Cristiano Bertolini, Martin Schäf, Ishan Banerjee, Atif M. Memon:
Lightweight Static Analysis for GUI Testing. 301-310 - Matt Staats, Pablo S. Loyola, Gregg Rothermel:
Oracle-Centric Test Case Prioritization. 311-320 - Nina Elisabeth Holt, Richard Torkar, Lionel C. Briand, Kai Hansen:
State-Based Testing: Industrial Evaluation of the Cost-Effectiveness of Round-Trip Path and Sneak-Path Strategies. 321-330 - Javier Alonso, Michael Grottke, Allen P. Nikora, Kishor S. Trivedi:
The Nature of the Times to Flight Software Failure during Space Missions. 331-340 - João Carlos Cunha, Ricardo Barbosa, Gilberto Rodrigues:
On the Use of Boundary Scan for Code Coverage of Critical Embedded Software. 341-350 - Mustafa Hammad, Jonathan Cook:
Compositional Verification of Sensor Software Using Uppall. 351-360 - Marc Frappier, Amel Mammar:
An Assertions-Based Approach to Verifying the Absence Property Pattern. 361-370 - Amina Magdich, Yessine Hadj Kacem, Adel Mahfoudhi, Mohamed Abid:
A MARTE Extension for Global Scheduling Analysis of Multiprocessor Systems. 371-379
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