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ORCIDIEEE International Conference on Edge Computing and Communications (EDGE)
IEEE International Conference on Edge Computing (EDGE)
7th EDGE 2023: Chicago, IL, USA
- Claudio A. Ardagna, Feras M. Awaysheh, Hongyi Bian, Carl K. Chang, Rong N. Chang, Flávia Coimbra Delicato, Nirmit Desai, Jing Fan, Geoffrey C. Fox, Andrzej Goscinski, Zhi Jin, Anna Kobusinska, Omer F. Rana:
IEEE International Conference on Edge Computing and Communications, EDGE 2023, Chicago, IL, USA, July 2-8, 2023. IEEE 2023, ISBN 979-8-3503-0483-1 [contents]
6th EDGE 2022: Barcelona, Spain
- Claudio Agostino Ardagna, Hongyi Bian, Carl K. Chang, Rong N. Chang, Ernesto Damiani, Gabriele Elia, Qiang He, Vicenç Puig, Robert Ward, Fatos Xhafa, Jia Zhang:
IEEE International Conference on Edge Computing and Communications, EDGE 2022, Barcelona, Spain, July 10-16, 2022. IEEE 2022, ISBN 978-1-6654-8140-3 [contents]
5th EDGE 2021: Chicago, IL, USA
- IEEE International Conference on Edge Computing, EDGE 2021, Chicago, IL, USA, September 5-10, 2021. IEEE 2021, ISBN 978-1-6654-0062-6 [contents]
4th EDGE 2020: Beijing, China
- 2020 IEEE International Conference on Edge Computing, EDGE 2020, Beijing, China, October 19-23, 2020. IEEE 2020, ISBN 978-1-7281-8254-4 [contents]
3rd EDGE 2019: Milan, Italy
- Elisa Bertino, Carl K. Chang, Peter Chen, Ernesto Damiani, Michael Goul, Katsunori Oyama:
3rd IEEE International Conference on Edge Computing, EDGE 2019, Milan, Italy, July 8-13, 2019. IEEE 2019, ISBN 978-1-7281-2708-8 [contents]
2nd EDGE 2018: San Francisco, CA, USA
- 2018 IEEE International Conference on Edge Computing, EDGE 2018, San Francisco, CA, USA, July 2-7, 2018. IEEE Computer Society 2018, ISBN 978-1-5386-7238-9 [contents]
1st EDGE 2017: Honolulu, HI, USA
- IEEE International Conference on Edge Computing, EDGE 2017, Honolulu, HI, USA, June 25-30, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-2017-5 [contents]
SEC 2016: Washington, DC, USA
- IEEE/ACM Symposium on Edge Computing, SEC 2016, Washington, DC, USA, October 27-28, 2016. IEEE Computer Society 2016, ISBN 978-1-5090-3322-5 [contents]
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