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• 
  Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio:
  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. IEEE 2023, ISBN 979-8-3503-1500-4 [contents]

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  Luca Cassano, Sreejit Chakravarty, Alberto Bosio:
  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. IEEE 2022, ISBN 978-1-6654-5938-9 [contents]

• 
  Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou:
  36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. IEEE 2021, ISBN 978-1-6654-1609-2 [contents]

• 
  Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua:
  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. IEEE 2020, ISBN 978-1-7281-9457-8 [contents]

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  2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. IEEE 2019, ISBN 978-1-7281-2260-1 [contents]

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  2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. IEEE Computer Society 2018, ISBN 978-1-5386-8398-9 [contents]

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  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-0362-8 [contents]

• 
  2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016. IEEE Computer Society 2016, ISBN 978-1-5090-3623-3 [contents]

• 
  2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. IEEE Computer Society 2015, ISBN 978-1-4799-8606-4 [contents]

• 
  2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. IEEE Computer Society 2014, ISBN 978-1-4799-6155-9 [contents]

• 
  2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013. IEEE Computer Society 2013 [contents]

• 
  2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-3043-5 [contents]

• 
  2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-1713-0 [contents]

• 
  25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-8447-8 [contents]

• 
  Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor:
  24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009. IEEE Computer Society 2009, ISBN 978-0-7695-3839-6 [contents]

• 
  Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor:
  23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3365-0 [contents]

• 
  Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba:
  22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. IEEE Computer Society 2007, ISBN 0-7695-2885-6 [contents]

• 
  21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. IEEE Computer Society 2006, ISBN 0-7695-2706-X [contents]

• 
  20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. IEEE Computer Society 2005, ISBN 0-7695-2464-8 [contents]

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  19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. IEEE Computer Society 2004, ISBN 0-7695-2241-6 [contents]

• 
  18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. IEEE Computer Society 2003, ISBN 0-7695-2042-1 [contents]

DFT 2002 Home Page

• 
  17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. IEEE Computer Society 2002, ISBN 0-7695-1831-1 [contents]

• 
  16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. IEEE Computer Society 2001, ISBN 0-7695-1203-8 [contents]

• 
  15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. IEEE Computer Society 2000, ISBN 0-7695-0719-0 [contents]

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  14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. IEEE Computer Society 1999, ISBN 0-7695-0325-X [contents]

• 
  13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings. IEEE Computer Society 1998, ISBN 0-8186-8832-7 [contents]

• 
  1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France. IEEE Computer Society 1997, ISBN 0-8186-8168-3 [contents]

• 
  1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. IEEE Computer Society 1996, ISBN 0-8186-7545-4 [contents]

• 
  1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995. IEEE Computer Society 1995, ISBN 0-8186-7107-6 [contents]

• 
  The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. IEEE Computer Society 1994, ISBN 0-8186-6307-3 [contents]

• 
  Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli:
  The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. IEEE Computer Society 1993, ISBN 0-8186-3502-9 [contents]

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